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高熵能源前沿论坛-50 Exploring Atomic Structures Using High-Resolution Transmission Electron Microscopy
发表日期: 2024-06-24 文章来源:
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  报告人:  丁勇   Georgia Institute of Technology  

  报告时间:2024619

  报告地点:科研楼一楼报告厅 

  联系人:  所长办 

  报告人简介: 

  Dr. Yong Ding graduated from Nanjing University, where he received both his Bachelor's degree (1996) and Ph.D. (2001) in Physics. After graduation, he worked as a research scientist at the Jülich Research Center in Germany. In 2003, Dr. Ding moved to Georgia Tech, where he served as a Post-Doctoral Fellow in the School of Materials Science and Engineering under the supervision of Professor Zhong Lin Wang. He is now a Principal Research Scientist at the Material Characterization Facility of the Georgia Institute of Technology. Dr. Ding's research interests focus on materials characterization, primarily using transmission electron microscopy. He has published over 250 papers, and his h-index is 101 according to Google Scholar. 

  报告摘要: 

  In high-angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM) images, atoms typically appear as bright dots. However, in transmission electron microscopy (TEM), interpreting the contrast is more complex, and we cannot directly associate bright or dark regions with atoms in the structure. To effectively utilize the structural information from high-resolution TEM (HRTEM) images, it is necessary to record a series of focused images and perform HRTEM simulations. In this talk, I will use CeO? as a model structure to demonstrate how to explore atomic structures and oxygen vacancy distributions from HRTEM images with the aid of image simulations. 

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